Dear Miss Michelle,

I need this kind os Silicon Wafers at best competitive price CIF Italy

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attachment:Values and Analytical methods

Parameter Values and Units Analytical methods Notes
Bulk purity Donors (P, As, Sb)Max. 300 pptaAcceptors (B, Al)Max. 100 ppta Dopants are determined on a floatzoned sample by Photo-luminescence Spectroscopy (FTPL) or by Infrared Absorption Analysis (FTIR). CZ POLY will be delivered as collective consignment with corresponding collectve lot numbers.
CarbonMax. 250 ppba Carbon is determined by Infrared Absorption Analysis (FTIR) on annealed polycrystalline samples.
Bulk MetalsTotal of bulk metals (Fe, Cu, Ni, Cr, Zn, Na) Max. 2 ppbw Bulk impurities are determined quarterly by applying Neutron Activation Analysis (NAA) to randomly selected pieces of polycrystalline silicon.
Surface Metals Fe max. 200 ppbwCu max. 1 ppbwNi max. 1 ppbwCr max. 1 ppbwZn max. 2 ppbwNa max. 6 ppbw Surface impurity levels are determined by Inductively Coupled Plasma (ICP), Atomic Emission Spectroscopy (AES) or other.
Resistivity Bulk + Surface ResistivityP-Type 1000 Ohm*cmN-Type 100 Ohm*cm

Size Length Weight Notes
Size 1Size 2Size 3Size 4 5 – 15 mm 5 – 45 mm20 – 65 mm20 – 150 mm Max. 6 %Max. 10%Max. 14%Min. 70 % No part of rods within 20 mm from electrode is included.


Parameter Notes
Surface condition Acid etched
Surface morphology, Discolourations and Stains Cut surfaces are allowed
Foreign substances Not allowed
Weight 10 kg ± 100 g per bag
Packing Double bagging with PE. Each bag individually sealed.

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contact person:Paolo Tomasello

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